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By A.K. HEAD, P. HUMBLE, L.M. CLAREBROUGH, A.J. MORTON and C.T. FORWOOD (Eds.)

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Extra info for Computed Electron Micrographs and Defect Identification

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G. , 1967) but it should be noted that in some texts cross-grating patterns are not always indexed consistently and in some cases a mixture of left and right-handed axis systems has been used. 2). Before the experimental information can be analysed, it is necessary to know the relative rotation between the image and the diffraction pattern which occurs as a result of the image forming process in an electron micro­ scope. This rotation must be determined, if it is not already known, and for this reason, before any of the methods listed above are discussed, a procedure for determining such rotations will be described.

There is an additional complication in anisotropic elasticity in that it is not possible to write down an explicit expression for R and this also has to be computed numerically. Before considering the derivation of R for an elastically anisotropic solid, it should be noted that what is set out here is only meant as a guide to under­ standing the micrograph program and is not in any sense a rigorous or com­ plete treatment of the subject. The reader is referred to original papers by Eshelby et al.

However, it is clear that the real situation corresponds to bringing various crystallographic directions into coincidence with the electron beam direction. 3, § 4 ] INDEXING ORIENTATION MAP A N D D I F F R A C T I N G VECTORS 49 Near each low index beam direction, images and diffraction patterns for several diffracting vectors should be photographed. For example, in a <112) pattern for a face-centred cubic crystal it would be usual to photograph images and diffrac­ tion patterns for the 111, 220 and 311 diffracting vectors.

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